XploRA series

• SWIFT TM technology: 10 times faster RAMAN image;
• Better detection and sensitivity;
• Full confocality for full image detail;
• Full optical microscope so you can see your samples;
• Compatible with atomic force microscopes for combination Raman-AFM and TERS;
• Complete system automation with software control and intuitive operation;
• Easily characterizes sample information such as crystallinity, polymorphism, residual stress and other structural and chemical analyses;
• Auto calibration options;
• XStainTM: instant chemometric analysis application;
  2 year warranty as standard on base unit.

Manufacturer: HORIBA

STEQ IS AUTHORIZED AND CERTIFIED BY HORIBA TO PROVIDE TECHNICAL SUPPORT AND SUPPLY ORIGINAL PARTS FOR THE ENTIRE LINE OF EQUIPMENT.

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